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ICCD
2003
IEEE
113views Hardware» more  ICCD 2003»
13 years 10 months ago
Multiple Transition Model and Enhanced Boundary Scan Architecture to Test Interconnects for Signal Integrity
As the technology is shrinking toward 50 nm and the working frequency is going into multi gigahertz range, the effect of interconnects on functionality and performance of system-o...
Mohammad H. Tehranipour, Nisar Ahmed, Mehrdad Nour...