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    ITC
    1989
    IEEE
    82views Hardware» more  ITC 1989»
    CMOS IC Stuck-Open Fault Electrical Effects and Design Considerations
    13 years 8 months ago
    CMOS IC Stuck-Open Fault Electrical Effects and Design Considerations
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    - The electrical effects of CMOS IC physical defects that caused stuck-openfaults are evaluated, including their voltage levels, quiescent power supply current (IDDQ), transient re...
    Jerry M. Soden, R. Keith Treece, Michael R. Taylor...
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