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    2004
    ACM
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    A scalable soft spot analysis methodology for compound noise effects in nano-meter circuits
    14 years 5 months ago
    A scalable soft spot analysis methodology for compound noise effects in nano-meter circuits
    Download  esdat.ucsd.edu
    Circuits using nano-meter technologies are becoming increasingly vulnerable to signal interference from multiple noise sources as well as radiation-induced soft errors. One way to...
    Chong Zhao, Xiaoliang Bai, Sujit Dey
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