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    IEEE
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    Towards STEM control: Modeling framework and development of a sensor for defocus control
    13 years 9 months ago
    Towards STEM control: Modeling framework and development of a sensor for defocus control
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    — Scanning transmission electron microscopes are indispensable tools for material science research, since they can reveal the internal structure of a wide range of specimens. Thu...
    Arturo Tejada, Wouter Van den Broek, Saartje W. va...
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