Sciweavers

    ICCAD
    2010
    IEEE
    108views Hardware» more  ICCAD 2010»
    Mathematical yield estimation for two-dimensional-redundancy memory arrays
    13 years 2 months ago
    Mathematical yield estimation for two-dimensional-redundancy memory arrays
    Download  tiger.ee.nctu.edu.tw
    Defect repair has become a necessary process to enhance the overall yield for memories since manufacturing a natural good memory is difficult in current memory technologies. This ...
    Mango Chia-Tso Chao, Ching-Yu Chin, Chen-Wei Lin
    claim paper
    Read More »
    Explore & Download
    Proceedings Preprints Top 5 Ranked Papers Publications Books Software Tutorials Presentations Lectures Notes Datasets
    Productivity Tools
    International On-screen Keyboard Graphical Social Symbols OCR Text Recognition CSS3 Style Generator Web Page to PDF Web Page to Image PDF Split PDF Merge Latex Equation Editor Sci2ools
    Document Tools
    PDF to Text PDF to Postscript PDF to Thumbnails Excel to PDF Word to PDF Postscript to PDF PowerPoint to PDF Latex to Word Repair Corrupted PDF
    Image Tools
    JPG to PS JPG to PDF Extract Images from PDF Image Converter
    Sciweavers
    About Community Cookies Privacy Policy Terms of Use

    Copyright © Sciweavers LLC, 2009-2024, USA.