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GLVLSI
2009
IEEE
125views VLSI» more  GLVLSI 2009»
14 years 2 days ago
Redundant wire insertion for yield improvement
Based on the insertion of internal and external redundant wires into L-type and U-type wires, an efficient two-phase reliability-driven insertion algorithm is proposed to insert r...
Jin-Tai Yan, Zhi-Wei Chen