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    DATE
    2005
    IEEE
    104views Hardware» more  DATE 2005»
    Defect Aware Test Patterns
    13 years 10 months ago
    Defect Aware Test Patterns
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    A method to generate test patterns referred to as defect aware test patterns is proposed. Defect aware test patterns have greater ability to detect un-modeled defects. The propose...
    Huaxing Tang, Gang Chen, Sudhakar M. Reddy, Chen W...
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