DATE
2003
IEEE
13 years 9 months ago
2003
IEEE
This paper presents a new and low-cost approach for identifying sequentially untestable faults. Unlike the single fault theorem, where the stuck-at fault is injected only in the r...
DSD
2007
IEEE
13 years 10 months ago
2007
IEEE
Similar to sequential test pattern generation, the problem of identifying untestable faults in sequential circuits remains unsolved. Most of the previous works in untestability id...
DDECS
2009
IEEE
13 years 11 months ago
2009
IEEE
—Automatic Test Pattern Generation (ATPG) based on Boolean satisfiability (SAT) has been shown to be a beneficial complement to traditional ATPG techniques. Boolean solvers wor...
ICCD
2005
IEEE
14 years 1 months ago
2005
IEEE
In this paper, we make two major contributions: First, to enhance Boolean learning, we propose a new class of logic implications called extended forward implications. Using a nove...