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    VLSID
    2005
    IEEE
    120views VLSI» more  VLSID 2005»
    On Finding Consecutive Test Vectors in a Random Sequence for Energy-Aware BIST Design
    13 years 10 months ago
    On Finding Consecutive Test Vectors in a Random Sequence for Energy-Aware BIST Design
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    During pseudorandom testing, a significant amount of energy and test application time is wasted for generating and for applying “useless” test vectors that do not contribute t...
    Sheng Zhang, Sharad C. Seth, Bhargab B. Bhattachar...
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