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    ATS
    2000
    IEEE
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    Compaction-based test generation using state and fault information
    13 years 8 months ago
    Compaction-based test generation using state and fault information
    Download  computing.ece.vt.edu
    We present a new test generation procedure for sequential circuits using newly traversed state and newly detected fault information obtained between successive iterations of vecto...
    Ashish Giani, Shuo Sheng, Michael S. Hsiao, Vishwa...
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