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    ICRA
    2005
    IEEE
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    Modeling of Haptic Sensing of Nanolithography with an Atomic Force Microscope
    13 years 10 months ago
    Modeling of Haptic Sensing of Nanolithography with an Atomic Force Microscope
    Download  www2.acae.cuhk.edu.hk
    - This paper describes a virtual reality interface between human and the Atomic Force Microscope (AFM), which allows the operator to perform nanomanipulation with an AFM tip in the...
    Lo Ming Fok, Yun-Hui Liu, Wen J. Li
    claim paper
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