VLSID
2002
IEEE
14 years 4 months ago
2002
IEEE
Increasing complexity of the functionalities and the resultant growth in number of gates integrated in a chip coupled with shrinking geometries and short cycle time requirements br...
VLSID
2002
IEEE
14 years 4 months ago
2002
IEEE
The development of application specific instruction set processors comprises several design phases: architecture exploration, software tools design, system verification and design...
VLSID
2002
IEEE
14 years 4 months ago
2002
IEEE
A control part ? data path partition based sequential circuit verification scheme aimed at avoiding state explosion comprises two major modules namely, a data path verifier and a ...
VLSID
2002
IEEE
14 years 4 months ago
2002
IEEE
This paper presents a novel approach for the synthesis of dynamic CMOS circuits using Domino and Nora styles. As these logic styles can implement only non-inverting logic, convent...
VLSID
2002
IEEE
14 years 4 months ago
2002
IEEE
Deep submicron technology calls for new design techniques, in which wire and gate delays are accounted to have equal or nearly equal effect on circuit behavior. Asynchronous speed...
VLSID
2002
IEEE
14 years 4 months ago
2002
IEEE
With device counts on modern-day ASICs crossing the 10 million mark, careful planning of an ASIC design project is necessary to meet time deadlines. Two problems arise in this con...
VLSID
2002
IEEE
14 years 4 months ago
2002
IEEE
VLSID
2002
IEEE
14 years 4 months ago
2002
IEEE
| This paper reports the design of BIST structures for sequential machines. Testability of an FSM is limited due to the fact that some machine states remain unreachable and some ac...
VLSID
2002
IEEE
14 years 4 months ago
2002
IEEE
IDDQ testing has been used as a test technique to supplement voltage testing of CMOS chips. The idea behind IDDQ testing is to declare a chip as faulty if the steady-state current...
VLSID
2002
IEEE
14 years 4 months ago
2002
IEEE
Low standby power dissipation is the primary need for most of the wireless applications for prolonged battery life. Traditionally ASIC solutions currently address either high densi...