VTS
2002
IEEE
13 years 9 months ago
2002
IEEE
The ever increasing trend to reduce DPM levels of memories requires tests with very high fault coverages. The very important class of dynamic fault, therefore cannot be ignored an...
VTS
2002
IEEE
13 years 9 months ago
2002
IEEE
High defect coverage requires good coverage of different fault types. In this paper, we present a comprehensive test vector generation technique for BIST, called Random Single Inp...
VTS
2002
IEEE
13 years 9 months ago
2002
IEEE
VTS
2002
IEEE
13 years 9 months ago
2002
IEEE
VTS
2002
IEEE
13 years 9 months ago
2002
IEEE
VTS
2002
IEEE
13 years 9 months ago
2002
IEEE
In this paper, we present a test pattern generation algorithm aiming at signal integrity faults on long interconnects. This is achieved by considering the effect of inputs and par...
VTS
2002
IEEE
13 years 9 months ago
2002
IEEE
Run-length codes and their variants have recently been shown to be very effective for compressing system-on-achip (SOC) test data. In this paper, we analyze the Golomb code, the c...