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WCRE
2002
IEEE
13 years 9 months ago
Relating Expectations to Automatically Recovered Design Patterns
At MITRE we are developing tools to aid analysts in assessing the operational usability and quality of object-oriented code. Our tools statically examine source code, automaticall...
Angel Asencio, Sam Cardman, David Harris, Ellen La...
WCRE
2002
IEEE
13 years 9 months ago
Exposing Data-Level Parallelism in Sequential Image Processing Algorithms
As new computer architectures are developed to exploit large-scale data-level parallelism, techniques are needed to retarget legacy sequential code to these platforms. Sequential ...
Lewis B. Baumstark Jr., Linda M. Wills