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JAVACARD
2000
15 years 9 months ago
Automatic Test Generation for Java-Card Applets
: Open-cards have introduced a new life cycle for smart card embedded applications. In the case of Java Card, they have raised the problem of embedded object-oriented applet valida...
Hugues Martin, Lydie du Bousquet
AAAI
2007
15 years 8 months ago
A Model-based Approach for Merging Prioritized Knowledge Bases in Possibilistic Logic
This paper presents a new approach for merging prioritized knowledge bases in possibilistic logic. Our approach is semantically defined by a model-based merging operator in propo...
Guilin Qi
DATE
2005
IEEE
110views Hardware» more  DATE 2005»
15 years 11 months ago
Rapid Generation of Thermal-Safe Test Schedules
Overheating has been acknowledged as a major issue in testing complex SOCs. Several power constrained system-level DFT solutions (power constrained test scheduling) have recently ...
Paul M. Rosinger, Bashir M. Al-Hashimi, Krishnendu...
MOR
2010
91views more  MOR 2010»
15 years 4 months ago
Bounding Probability of Small Deviation: A Fourth Moment Approach
In this paper we study the problem of bounding the value of the probability distribution function of a random variable X at E[X] + a where a is a small quantity in comparison with...
Simai He, Jiawei Zhang, Shuzhong Zhang
GECCO
2007
Springer
196views Optimization» more  GECCO 2007»
16 years 5 days ago
An estimation of distribution algorithm with guided mutation for a complex flow shop scheduling problem
An Estimation of Distribution Algorithm (EDA) is proposed to approach the Hybrid Flow Shop with Sequence Dependent Setup Times and Uniform Machines in parallel (HFSSDST-UM) proble...
Abdellah Salhi, José Antonio Vázquez...