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DATE
2005
IEEE
126views Hardware» more  DATE 2005»
15 years 5 months ago
The Accidental Detection Index as a Fault Ordering Heuristic for Full-Scan Circuits
We investigate a new fault ordering heuristic for test generation in full-scan circuits. The heuristic is referred to as the accidental detection index. It associates a value ADI ...
Irith Pomeranz, Sudhakar M. Reddy
ICSE
1999
IEEE-ACM
15 years 4 months ago
Using a Goal-Driven Approach to Generate Test Cases for GUIs
The widespread use of GUIs for interacting with software is leading to the construction of more and more complex GUIs. With the growing complexity comes challenges in testing the ...
Atif M. Memon, Martha E. Pollack, Mary Lou Soffa
KDD
2003
ACM
205views Data Mining» more  KDD 2003»
16 years 6 days ago
The data mining approach to automated software testing
In today's industry, the design of software tests is mostly based on the testers' expertise, while test automation tools are limited to execution of pre-planned tests on...
Mark Last, Menahem Friedman, Abraham Kandel
GECCO
2006
Springer
162views Optimization» more  GECCO 2006»
15 years 3 months ago
Improving evolutionary real-time testing
Embedded systems are often used in a safety-critical context, e.g. in airborne or vehicle systems. Typically, timing constraints must be satisfied so that real-time embedded syste...
Marouane Tlili, Stefan Wappler, Harmen Sthamer
BMCBI
2007
123views more  BMCBI 2007»
14 years 12 months ago
PedGenie: meta genetic association testing in mixed family and case-control designs
Background-: PedGenie software, introduced in 2006, includes genetic association testing of cases and controls that may be independent or related (nuclear families or extended ped...
Karen Curtin, Jathine Wong, Kristina Allen-Brady, ...