677 search results - page 25 / 136 » A New Start-Up Demonstration Test |
ICML
2004
IEEE
16 years 18 days ago
2004
IEEE
We propose a simple, novel and yet effective method for building and testing decision trees that minimizes the sum of the misclassification and test costs. More specifically, we f...
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IEEEARES
2010
IEEE
15 years 4 months ago
2010
IEEE
Many software security vulnerabilities only reveal themselves under certain conditions, i.e., particular configurations of the software together with its particular runtime environ...
TCIAIG
2010
14 years 6 months ago
2010
It is easy to create new combinatorial games but more difficult to predict those that will interest human players. We examine the concept of game quality, its automated measurement...
ITC
2003
IEEE
15 years 5 months ago
2003
IEEE
Very Deep Sub-Micron (VDSM) defects are resolved as Statistical Post-Processing™ (SPP) outliers of a new IDDQ screen. The screen applies an IDDQ pattern once to the Device Under...
VTS
2007
IEEE
15 years 6 months ago
2007
IEEE
The sensitivity of very deep submicron designs to supply voltage noise is increasing due to higher path delay variations and reduced noise margins with supply noise scaling. The s...