9316 search results - page 234 / 1864 » Analysis of traceback techniques |
147
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DATE
2009
IEEE
16 years 7 days ago
2009
IEEE
NBTI (Negative Bias Temperature Instability) has emerged as the dominant PMOS device failure mechanism for sub100nm VLSI designs. There is little research to quantify its impact o...
162
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DATE
2009
IEEE
16 years 7 days ago
2009
IEEE
Since pre-silicon functional verification is insufficient to detect all design errors, re-spins are often needed due to malfunctions that escape into the silicon. This paper pre...
158
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FMICS
2009
Springer
16 years 1 days ago
2009
Springer
Cell libraries often contain a simulation model in a system design language, such as Verilog. These languages usually involve nondeterminism, which in turn, poses a challenge to th...
134
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ISVC
2009
Springer
16 years 1 days ago
2009
Springer
We describe a new technique to extract the boundary of a walking subject, with ability to predict movement in missing frames. This paper uses a level sets representation of the tra...
159
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ICSEA
2008
IEEE
15 years 12 months ago
2008
IEEE
In this paper we propose that formal modelling techniques are necessary in establishing the trustworthiness of e-voting systems and the software within. We illustrate how a distri...