270 search results - page 23 / 54 » Automated test generation for industrial Erlang applications |
CODES
2008
IEEE
15 years 1 months ago
2008
IEEE
Functional validation is a major bottleneck in microprocessor design methodology. Simulation is the widely used method for functional validation using billions of random and biase...
HICSS
2005
IEEE
15 years 5 months ago
2005
IEEE
Nicholas Carr’s question “Does IT Matter?”(to the maintenance of competitive advantage) has been applied to many industries but the one that depends on IT almost exclusively...
ISQED
2005
IEEE
15 years 5 months ago
2005
IEEE
In this paper, design and measurement results of a test chip that intends to evaluate differences between layout techniques for rectangular unit-capacitor arrays are introduced. P...
TCAD
2002
14 years 11 months ago
2002
Test scheduling is an important problem in system-on-a-chip (SOC) test automation. Efficient test schedules minimize the overall system test application time, avoid test resource c...
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APSEC
2006
IEEE
15 years 5 months ago
2006
IEEE
Model-based software development is gaining interest in domains such as avionics, space, and automotives. The model serves as the central artifact for the development efforts (suc...