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    DAC
    2003
    ACM
    127views Computer Architecture» more  DAC 2003»
    Statistical timing for parametric yield prediction of digital integrated circuits
    15 years 10 months ago
    Statistical timing for parametric yield prediction of digital integrated circuits
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    Jochen A. G. Jess, K. Kalafala, Srinath R. Naidu, ...
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    DAC
    2004
    ACM
    101views Computer Architecture» more  DAC 2004»
    A synthesis flow toward fast parasitic closure for radio-frequency integrated circuits
    15 years 10 months ago
    A synthesis flow toward fast parasitic closure for radio-frequency integrated circuits
    Download  www.cdnusers.org
    Gang Zhang, E. Aykut Dengi, Ronald A. Rohrer, Rob ...
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    VLSID
    2005
    IEEE
    153views VLSI» more  VLSID 2005»
    Electromigration-Aware Physical Design of Integrated Circuits
    15 years 10 months ago
    Electromigration-Aware Physical Design of Integrated Circuits
    Download  www.tu-dresden.de
    The electromigration effect within current-density-stressed signal and power lines is an ubiquitous and increasingly important reliability and design problem in sub-micron IC desi...
    Göran Jerke, Jens Lienig
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    ICCAD
    2001
    IEEE
    77views Hardware» more  ICCAD 2001»
    Practical Considerations in RLCK Crosstalk Analysis for Digital Integrated Circuits
    15 years 6 months ago
    Practical Considerations in RLCK Crosstalk Analysis for Digital Integrated Circuits
    Download  www.cisl.columbia.edu
    Steven C. Chan, Kenneth L. Shepard
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    3DIC
    2009
    IEEE
    138views Hardware» more  3DIC 2009»
    Wafer-scale 3D integration of InGaAs image sensors with Si readout circuits
    15 years 4 months ago
    Wafer-scale 3D integration of InGaAs image sensors with Si readout circuits
    Download  www.soiconsortium.org
    Chang-Lee Chen, D.-R. Yost, Jeffrey M. Knecht, Dav...
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