4299 search results - page 399 / 860 » Concurrent Test Generation |
158
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EVOW
2010
Springer
16 years 26 days ago
2010
Springer
We investigate user-guided evolution for the development of virtual 3D building structures for the prototype (commercial) game Subversion, which is being developed by Introversion ...
160
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DDECS
2006
IEEE
16 years 2 days ago
2006
IEEE
- Extension of a BIST design algorithm is proposed in this paper. The method is based on a synthesis of a combinational block - the decoder, transforming pseudo-random code words i...
159
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ISQED
2005
IEEE
15 years 11 months ago
2005
IEEE
In this paper, design and measurement results of a test chip that intends to evaluate differences between layout techniques for rectangular unit-capacitor arrays are introduced. P...
159
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DATE
1998
IEEE
15 years 10 months ago
1998
IEEE
Built-in self-test BIST techniques modify functional hardware to give a data path the capability to test itself. The modi cation of data path registers into registers BIST resourc...
172
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VLSID
2000
IEEE
15 years 9 months ago
2000
IEEE
We address the problem of verifying the correctness of pre-silicon models of a microprocessor. We touch on the latest advances in this area by considering two different aspects of...