138 search results - page 13 / 28 » Delay modeling and static timing analysis for MTCMOS circuit... |
ISQED
2003
IEEE
15 years 5 months ago
2003
IEEE
The amplitude of coupled noise is often used in estimating the crosstalk effect. Coupling noise-induced delay measures the impact of crosstalk on circuit performance. Efficient c...
118
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DAC
2008
ACM
16 years 20 days ago
2008
ACM
Soft errors, once only of concern in memories, are beginning to affect logic as well. Determining the soft error rate (SER) of a combinational circuit involves three main masking ...
DATE
2010
IEEE
15 years 4 months ago
2010
IEEE
With aggressive gate oxide scaling, latent defects in the gate oxide manifest as traps that, in time, lead to gate oxide breakdown. Progressive gate oxide breakdown, also referred...
ATS
2009
IEEE
14 years 9 months ago
2009
IEEE
Negative bias temperature instability (NBTI) has been a significant reliability concern in current digital circuit design due to its effect of increasing the path delay with time a...
124
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RTSS
2006
IEEE
15 years 5 months ago
2006
IEEE
In this paper, we study temperature-constrained hard realtime systems, where real-time guarantees must be met without exceeding safe temperature levels within the processor. Dynam...