473 search results - page 60 / 95 » Design Methodologies for Noise in Digital Integrated Circuit... |
ISLPED
2005
ACM
15 years 5 months ago
2005
ACM
Intrinsic variations and challenging leakage control in today’s bulk-Si MOSFETs limit the scaling of SRAM. Design tradeoffs in six-transistor (6-T) and four-transistor (4-T) SRA...
DATE
2009
IEEE
15 years 6 months ago
2009
IEEE
Abstract—Reliable and verifiable hardware, software and content usage metering (HSCM) are of primary importance for wide segments of e-commerce including intellectual property a...
ISPD
2005
ACM
15 years 5 months ago
2005
ACM
In the nanometer VLSI technology, the variation effects like manufacturing variation, power supply noise, temperature etc. become very significant. As one of the most vital nets...
ISQED
2003
IEEE
15 years 5 months ago
2003
IEEE
As the portion of coupling capacitance increases in smaller process geometries, accurate coupled noise analysis is becoming more important in current design methodologies. We prop...
DAC
2002
ACM
16 years 23 days ago
2002
ACM
At-speed testing of high-speed circuits is becoming increasingly difficult with external testers due to the growing gap between design and tester performance, growing cost of high...