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DAC
2012
ACM
13 years 1 months ago
Statistical design and optimization for adaptive post-silicon tuning of MEMS filters
Large-scale process variations can significantly limit the practical utility of microelectro-mechanical systems (MEMS) for RF (radio frequency) applications. In this paper we desc...
Fa Wang, Gokce Keskin, Andrew Phelps, Jonathan Rot...
DAC
2008
ACM
15 years 11 months ago
Study of the effects of MBUs on the reliability of a 150 nm SRAM device
1 Soft errors induced by radiation are an increasing problem in the microelectronic field. Although traditional models estimate the reliability of memories suffering Single Event U...
Juan Antonio Maestro, Pedro Reviriego
TSMC
2010
14 years 5 months ago
Automated Modeling of Dynamic Reliability Block Diagrams Using Colored Petri Nets
Computer system reliability is conventionally modeled and analyzed using techniques such as fault tree analysis (FTA) and reliability block diagrams (RBD), which provide static rep...
Ryan Robidoux, Haiping Xu, Liudong Xing, MengChu Z...
DAC
2009
ACM
15 years 11 months ago
Interconnection fabric design for tracing signals in post-silicon validation
Post-silicon validation has become an essential step in the design flow of today's complex integrated circuits. One effective technique that provides real-time visibility to ...
Xiao Liu, Qiang Xu
DAC
2009
ACM
15 years 5 months ago
Information hiding for trusted system design
For a computing system to be trusted, it is equally important to verify that the system performs no more and no less functionalities than desired. Traditional testing and verifica...
Junjun Gu, Gang Qu, Qiang Zhou