Due to the increased speed in modern designs, testing for delay faults has become an important issue in the postproduction test of manufactured chips. A high fault coverage is nee...
Abstract. This paper studies a risk minimization approach to estimate a transformation model from noisy observations. It is argued that transformation models are a natural candidat...
Vanya Van Belle, Kristiaan Pelckmans, Johan A. K. ...
Based on rank-1 update, Sparse Bayesian Learning Algorithm (SBLA) is proposed. SBLA has the advantages of low complexity and high sparseness, being very suitable for large scale pr...
This paper has no novel learning or statistics: it is concerned with making a wide class of preexisting statistics and learning algorithms computationally tractable when faced wit...