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    MSR
    2009
    ACM
    167views Software Engineering» more  MSR 2009»
    MapReduce as a general framework to support research in Mining Software Repositories (MSR)
    15 years 4 months ago
    MapReduce as a general framework to support research in Mining Software Repositories (MSR)
    Download  sail.cs.queensu.ca
    Researchers continue to demonstrate the benefits of Mining Software Repositories (MSR) for supporting software development and research activities. However, as the mining process...
    Weiyi Shang, Zhen Ming Jiang, Bram Adams, Ahmed E....
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    EIT
    2008
    IEEE
    82views Information Technology» more  EIT 2008»
    Use of local biasing in designing analog integrated circuits
    15 years 6 months ago
    Use of local biasing in designing analog integrated circuits
    Download  www.ceet.niu.edu
    —A new biasing technique called “local biasing” of transistors is used to design analog integrated circuit amplifiers, or any other analog ICs. The technique is based on desi...
    Reza Hashemian
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    FLAIRS
    2008
    79views Artificial Intelligence» more  FLAIRS 2008»
    Multilingual Approach to e-Learning from a Monolingual Perspective
    15 years 2 months ago
    Multilingual Approach to e-Learning from a Monolingual Perspective
    Download  www.lt4el.eu
    This paper describes the efforts undertaken in an international research project LT4eL from the perspective of one of the participating languages, Czech. The project aims at explo...
    Vladislav Kubon, Miroslav Spousta
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    RSA
    2008
    81views more  RSA 2008»
    Analyzing linear mergers
    14 years 11 months ago
    Analyzing linear mergers
    Download  www.wisdom.weizmann.ac.il
    Mergers are functions that transform k (possibly dependent) random sources into a single random source, in a way that ensures that if one of the input sources has minentropy rate ...
    Zeev Dvir, Ran Raz
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    MR
    2007
    83views Robotics» more  MR 2007»
    Active ESD protection circuit design against charged-device-model ESD event in CMOS integrated circuits
    14 years 11 months ago
    Active ESD protection circuit design against charged-device-model ESD event in CMOS integrated circuits
    Download  www.ics.ee.nctu.edu.tw
    CDM ESD event has become the main ESD reliability concern for integrated-circuits products using nanoscale CMOS technology. A novel CDM ESD protection design, using self-biased cu...
    Shih-Hung Chen, Ming-Dou Ker
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