The article is concerned with an approach to model based test development for large software systems. The approach presented is a part of UniTesK test development technology, which...
Continuously shrinking feature sizes result in an increasing susceptibility of circuits to transient faults, e.g. due to environmental radiation. Approaches to implement fault tol...
Post-silicon debug is the problem of determining what's wrong when the fabricated chip of a new design behaves incorrectly. This problem now consumes over half of the overall ...
Flavio M. de Paula, Marcel Gort, Alan J. Hu, Steve...
paper, we present an abstract formal model of decision-making in a social setting that covers all aspects of the process, from recognition of a potential for cooperation through t...
Pietro Panzarasa, Nicholas R. Jennings, Timothy J....
The large gap in the levels at which requirements are specified results in inadequate means for ensuring that business goals are properly supported. Architecture-level requirement...