6328 search results - page 94 / 1266 » From Quantity to Quality |
ICAS
2009
IEEE
15 years 6 months ago
2009
IEEE
—As IMS becomes more available to academia and industry, the requirements for IMS clients are growing faster than ever. From all IMS components, IMS clients are vital components ...
ISSRE
2005
IEEE
15 years 5 months ago
2005
IEEE
A classic question in software development is “H ow much testing is enough?” Aside from dynamic coverage-based metrics, there are few measures that can be used to provide guid...
ITC
2003
IEEE
15 years 5 months ago
2003
IEEE
This paper describes a Hybrid DFT (H-DFT) architecture for low-cost, high quality structural testing in the high volume manufacturing (HVM) environment. This structure efficiently...
110
click to vote
ICIP
2002
IEEE
15 years 4 months ago
2002
IEEE
Most model based rate control solutions have the generally questionable assumption that video sequence is stationary, and also suffer from the fundamental problems of model parame...
DATE
2000
IEEE
15 years 4 months ago
2000
IEEE
An objective of DSP testing should be to ensure that any errors due to missed faults are infrequent compared to a circuit’s intrinsic errors, such as overflow. A method is prop...