2072 search results - page 50 / 415 » Multibook's test environment |
131
Voted
VTS
2005
IEEE
15 years 11 months ago
2005
IEEE
Excessive power supply noise can lead to overkill during delay test. A static compaction algorithm is described in this paper that prevents such overkill. A power supply noise est...
ITC
2003
IEEE
15 years 10 months ago
2003
IEEE
We present a measurement module that computes the charge from the transient supply current and provides a digital value of this magnitude. The module is constructed to provide a f...
121
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GECCO
2008
Springer
15 years 6 months ago
2008
Springer
In this paper, we report on our investigation of factors affecting the performance of various parallelization paradigms for multiobjective evolutionary algorithms. Different paral...
125
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CHI
2007
ACM
16 years 5 months ago
2007
ACM
In this paper, we describe various setups that allow usability professionals to conduct effective user studies on mobile devices. We describe the factors relevant when building a ...
174
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SEUS
2007
IEEE
15 years 11 months ago
2007
IEEE
In this paper we present a distributed Hardware-in-the-Loop (HiL) simulation approach that supports the verification and validation activities in an integrated architecture as rec...