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VLSID
2007
IEEE
154views VLSI» more  VLSID 2007»
16 years 5 months ago
Model Based Test Generation for Microprocessor Architecture Validation
Functional validation of microprocessors is growing in complexity in current and future microprocessors. Traditionally, the different components (or validation collaterals) used i...
Sreekumar V. Kodakara, Deepak Mathaikutty, Ajit Di...
DAWAK
2003
Springer
15 years 10 months ago
Performance Tests in Data Warehousing ETLM Process for Detection of Changes in Data Origin
In a data warehouse (DW) environment, when the operational environment does not posses or does not want to inform the data about the changes that occurred, controls have to be impl...
Rosana L. de B. A. Rocha, Leonardo Figueiredo Card...
DFT
2005
IEEE
92views VLSI» more  DFT 2005»
15 years 11 months ago
Simulating Faults of Combinational IP Core-based SOCs in a PLI Environment
This paper presents a new test methodology which utilizes the Programming Language Interface (PLI) for performing fault simulation of combinational or full scan Intellectual Prope...
Pedram A. Riahi, Zainalabedin Navabi, Fabrizio Lom...
ERCIMDL
2003
Springer
165views Education» more  ERCIMDL 2003»
15 years 10 months ago
Automatic Multi-label Subject Indexing in a Multilingual Environment
Abstract. This paper presents an approach to automatically subject index fulltext documents with multiple labels based on binary support vector machines (SVM). The aim was to test ...
Boris Lauser, Andreas Hotho
ICSE
2001
IEEE-ACM
15 years 10 months ago
Case Study: Extreme Programming in a University Environment
Extreme Programming (XP) is a new and controversial sojiware processfor small teams. A practical training courseat the universityof Karlsruheled to thefollowing observations about...
Matthias M. Müller, Walter F. Tichy