3413 search results - page 256 / 683 » New Support Vector Algorithms |
179
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DATE
1999
IEEE
15 years 10 months ago
1999
IEEE
Test application time is an important factor in the overall cost of VLSI chip testing. We present a new ATPG approach for generating compact test sequences for sequential circuits...
138
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INTERSPEECH
2010
15 years 25 days ago
2010
In this paper, we propose to improve our previously developed method for joint compensation of additive and convolutive distortions (JAC) applied to model adaptation. The improvem...
169
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AINA
2004
IEEE
15 years 9 months ago
2004
IEEE
Abstract-- As intrusion detection essentially can be formulated as a binary classification problem, it thus can be solved by an effective classification technique-Support Vector Ma...
178
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PR
2006
15 years 6 months ago
2006
A novel training method has been proposed for increasing efficiency and generalization of support vector machine (SVM). The efficiency of SVM in classification is directly determi...
162
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DATAMINE
2006
15 years 6 months ago
2006
Clustering with partial supervision finds its application in situations where data is neither entirely nor accurately labeled. This paper discusses a semisupervised clustering algo...