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ISPASS
2008
IEEE
15 years 6 months ago
Metrics for Architecture-Level Lifetime Reliability Analysis
Abstract— This work concerns metrics for evaluating microarchitectural enhancements to improve processor lifetime reliability. A commonly reported reliability metric is mean time...
Pradeep Ramachandran, Sarita V. Adve, Pradip Bose,...
ICCV
2007
IEEE
16 years 1 months ago
Globally Optimal Affine and Metric Upgrades in Stratified Autocalibration
We present a practical, stratified autocalibration algorithm with theoretical guarantees of global optimality. Given a projective reconstruction, the first stage of the algorithm ...
Manmohan Krishna Chandraker, Sameer Agarwal, David...
ICASSP
2011
IEEE
14 years 3 months ago
Accurate transcription of broadcast news speech using multiple noisy transcribers and unsupervised reliability metrics
Professional manual transcription of speech is an expensive and time consuming process. This paper focuses on the problem of combining noisy transcriptions from multiple non-exper...
Kartik Audhkhasi, Panayiotis G. Georgiou, Shrikant...
CORR
2010
Springer
108views Education» more  CORR 2010»
14 years 9 months ago
Affine Invariant, Model-Based Object Recognition Using Robust Metrics and Bayesian Statistics
We revisit the problem of model-based object recognition for intensity images and attempt to address some of the shortcomings of existing Bayesian methods, such as unsuitable prior...
Vasileios Zografos, Bernard F. Buxton
PODS
2004
ACM
148views Database» more  PODS 2004»
15 years 12 months ago
Deterministic Wavelet Thresholding for Maximum-Error Metrics
Several studies have demonstrated the effectiveness of the wavelet decomposition as a tool for reducing large amounts of data down to compact wavelet synopses that can be used to ...
Minos N. Garofalakis, Amit Kumar