The problem of diagnosis – or locating the source of an error or fault – occurs in several areas of Computer Aided Design, such as dynamic verification, property checking, eq...
This paper describes a technique which uses the Differential Non Linearity (DNL) test data for fault location and identification of the analog components of a flash ADC. In a flash...
- A Cyclic-CPRS (Column Parity Row Selection) technique is presented to diagnose built-in self tested (BISTed) circuits, even in the presence of many unknowns and transient errors....
Chun-Yi Lee, Hung-Mao Lin, Fang-Min Wang, James Ch...
—As circuits continue to scale to smaller feature sizes, wearout and latent defects are expected to cause an increasing number of errors in the field. Online error detection tec...
Nuno Alves, Y. Shi, N. Imbriglia, Jennifer Dworak,...
— This paper is intended to compare the performance of four different types of fuzzy aggregation methods in classification of epilepsy risk levels from EEG Signal parameters. The...