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JAVACARD
2000
15 years 9 months ago
Automatic Test Generation for Java-Card Applets
: Open-cards have introduced a new life cycle for smart card embedded applications. In the case of Java Card, they have raised the problem of embedded object-oriented applet valida...
Hugues Martin, Lydie du Bousquet
TCAD
2002
134views more  TCAD 2002»
15 years 5 months ago
Testing and diagnosis of interconnect faults in cluster-based FPGA architectures
As IC densities are increasing, cluster-based FPGA architectures are becoming the architecture of choice for major FPGA manufacturers. A cluster-based architecture is one in which...
Ian G. Harris, Russell Tessier
DAC
2008
ACM
16 years 6 months ago
Partial order reduction for scalable testing of systemC TLM designs
A SystemC simulation kernel consists of a deterministic implementation of the scheduler, whose specification is nondeterministic. To leverage testing of a SystemC TLM design, we f...
Sudipta Kundu, Malay K. Ganai, Rajesh Gupta
FOCS
2002
IEEE
15 years 10 months ago
A Lower Bound for Testing 3-Colorability in Bounded-Degree Graphs
We consider the problem of testing 3-colorability in the bounded-degree model. We show that, for small enough ε, every tester for 3colorability must have query complexity Ω(n)....
Andrej Bogdanov, Kenji Obata, Luca Trevisan
CODES
2006
IEEE
15 years 11 months ago
A formal approach to robustness maximization of complex heterogeneous embedded systems
Embedded system optimization typically considers objectives such as cost, timing, buffer sizes and power consumption. Robustness criteria, i.e. sensitivity of the system to variat...
Arne Hamann, Razvan Racu, Rolf Ernst