We present BonnPlace, a new VLSI placement algorithm that combines the advantages of analytical and partitioning-based placers. Based on (non-disjoint) placements minimizing the t...
A built-in self-test (BIST) scheme is presented which both reduces overhead for detecting random-pattern-resistant (r.p.r.) faults as well as reduces power consumption during test...
Linear decompressors are the dominant methodology used in commercial test data compression tools. However, they are generally not able to exploit correlations in the test data, an...
Creating a high throughput sparse matrix vector multiplication (SpMxV) implementation depends on a balanced system design. In this paper, we introduce the innovative SpMxV Solver ...
Junqing Sun, Gregory D. Peterson, Olaf O. Storaasl...
The main contribution of this work is an analytical model for finding the upper bound on the temperature difference among various locations on the die. The proposed model can be u...