2449 search results - page 265 / 490 » VLSI |
169
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VLSID
2010
IEEE
15 years 4 months ago
2010
IEEE
Due to the inherent nature of heat flow in 3D integrated circuits, stacked dies exhibit a wide range of thermal characteristics. The strong dependence of leakage with temperature...
166
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ASPDAC
2010
ACM
15 years 4 months ago
2010
ACM
Abstract--In nanometer-scale VLSI physical design, clock network becomes a major concern on determining the total performance of digital circuit. Clock skew and PVT (Process, Volta...
198
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VLSID
2010
IEEE
15 years 3 months ago
2010
IEEE
Directed test generation is important for the functional verification of complex system-on-chip designs. SAT based bounded model checking is promising for counterexample generatio...
217
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GLVLSI
2009
IEEE
15 years 3 months ago
2009
IEEE
To assist in dynamic assertion-based verification, we present a method to automatically build a test vector generator from a temporal property. Based on the duality between monito...
188
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GLVLSI
2009
IEEE
15 years 3 months ago
2009
IEEE
Distributing power and ground to a vertically integrated system is a complex and difficult task. Interplane communication and power delivery are achieved by through silicon vias (...