DFT 2009 IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems
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Wall of Fame | Most Viewed DFT-2009 Paper
DFT
2009
IEEE
13 years 7 months ago
2009
IEEE
Optimizing the BIST configuration based on the characteristics of the design under test is a complicated and challenging work for test engineers. Since this problem has multiple o...
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