DFT   2009 IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems
Wall of Fame | Most Viewed DFT-2009 Paper
210views VLSI» more  DFT 2009»
8 years 7 months ago
Optimizing Parametric BIST Using Bio-inspired Computing Algorithms
Optimizing the BIST configuration based on the characteristics of the design under test is a complicated and challenging work for test engineers. Since this problem has multiple o...
Nastaran Nemati, Amirhossein Simjour, Amirali Ghof...
Disclaimer and Copyright Notice
Sciweavers respects the rights of all copyright holders and in this regard, authors are only allowed to share a link to their preprint paper on their own website. Every contribution is associated with a desciptive image. It is the sole responsibility of the authors to ensure that their posted image is not copyright infringing. This service is compliant with IEEE copyright.
1Download preprint from source210
2Download preprint from source189
3Download preprint from source178
4Download preprint from source175
5Download preprint from source155
6Download preprint from source154
7Download preprint from source139
8Download preprint from source127
9Download preprint from source106