ICCAD   1991 International Conference on Computer-Aided Design
Wall of Fame | Most Viewed ICCAD-1991 Paper
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DIATEST: A Fast Diagnostic Test Pattern Generator for Combinational Circuits
This paper presents an efficient algorithm for the generation of diagnostic test patterns which distinguish between two arbitrary single stuck-at faults. The algorithm is able to ...
Torsten Grüning, Udo Mahlstedt, Hartmut Koopm...
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