IDEAL 2010 International Conference on Intelligent Data Engineering and Automated Learning
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Wall of Fame | Most Viewed IDEAL-2010 Paper
IDEAL
2010
Springer
13 years 2 months ago
2010
Springer
Based on studies and experiments on the loss term of SVMs, we argue that 1-norm measurement is better than 2-norm measurement for outlier resistance. Thus, we modify the previous 2...
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