Using a Log-normal Failure Rate Distribution for Worst Case Bound Reliability Prediction

Prior research has suggested that the failure rates of faults follow a log normal distribution. We propose a specific model where distributions close to a log normal arise naturally from the program structure. The log normal distribution presents a problem when used in reliability growth models as it is not mathematically tractable. However we demonstrate that a worst case bound can be estimated that is less pessimistic than our earlier worst case bound theory.

• Type: Conference
• Year: 2003
• Where: ISSRE
• Authors: Peter G. Bishop, Robin E. Bloomfield
• Keywords: ISSRE 2003, Log Normal, Log Normal Distribution, Worst Case Bound