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11

TODAES
1998

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Confidence analysis for defect-level estimation of VLSI random testing

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Confidence analysis for defect-level estimation of VLSI random testing

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Wen-Ben Jone, K. S. Tsai

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Added	23 Dec 2010
Updated	23 Dec 2010
Type	Journal
Year	1998
Where	TODAES
Authors	Wen-Ben Jone, K. S. Tsai

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