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DELTA
2010
IEEE

(Some) Open Problems to Incorporate BIST in Complex Heterogeneous Integrated Systems

13 years 3 months ago
(Some) Open Problems to Incorporate BIST in Complex Heterogeneous Integrated Systems
This paper presents an overview of test techniques that offer promising features when Built-In-Self-Test (BIST) must be applied to complex intgrated systems including analog, mixed-signal and RF parts. Emphasis is on techniques exhibiting a good trade-off between test requirements (basically in terms of signal accuracy and frequency) and test quality.
Manuel J. Barragan Asian, Gloria Huertas, Adoraci&
Added 24 Jan 2011
Updated 24 Jan 2011
Type Journal
Year 2010
Where DELTA
Authors Manuel J. Barragan Asian, Gloria Huertas, Adoración Rueda, José Luis Huertas
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