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    Blackbox identity testing for bounded top fanin depth-3 circuits: the field doesn't matter

    12 years 11 months ago
    Blackbox identity testing for bounded top fanin depth-3 circuits: the field doesn't matter
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    Nitin Saxena, C. Seshadhri
    claim paper
    Added 14 May 2011
    Updated 14 May 2011
    Type Journal
    Year 2010
    Where CORR
    Authors Nitin Saxena, C. Seshadhri
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