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DATE
2008
IEEE

Globally Optimized Robust Systems to Overcome Scaled CMOS Reliability Challenges

13 years 11 months ago
Globally Optimized Robust Systems to Overcome Scaled CMOS Reliability Challenges
Future system design methodologies must accept the fact that the underlying hardware will be imperfect, and enable design of robust systems that are resilient to hardware imperfections. Three techniques that can enable a sea change
Subhasish Mitra
Added 29 May 2010
Updated 29 May 2010
Type Conference
Year 2008
Where DATE
Authors Subhasish Mitra
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