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    ISQED
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    IEEE
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    A Test-Structure to Efficiently Study Threshold-Voltage Variation in Large MOSFET Arrays

    13 years 10 months ago
    A Test-Structure to Efficiently Study Threshold-Voltage Variation in Large MOSFET Arrays
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    Nigel Drego, Anantha Chandrakasan, Duane S. Boning
    claim paper
    Added 04 Jun 2010
    Updated 04 Jun 2010
    Type Conference
    Year 2007
    Where ISQED
    Authors Nigel Drego, Anantha Chandrakasan, Duane S. Boning
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