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2008
ACM

Automatic software fault localization using generic program invariants

9 years 11 months ago
Automatic software fault localization using generic program invariants
Despite extensive testing in the development phase, residual defects can be a great threat to dependability in the operational phase. This paper studies the utility of lowcost, generic invariants ("screeners") in their capacity of error detectors within a spectrum-based fault localization (SFL) approach aimed to diagnose program defects in the operational phase. The screeners considered are simple bitmask and range invariants that screen every load/store and function argument/return program point. Their generic nature allows them to be automatically instrumented without any programmer-effort, while training is straightforward given the test cases available in the development phase. Experiments based on the Siemens program set demonstrate diagnostic performance that is similar to the traditional, development-time application of SFL based on the program pass/fail information known before-hand. This diagnostic performance is currently attained at an average 14% screener executi...
Rui Abreu, Alberto González 0002, Peter Zoe
Added 28 Dec 2010
Updated 28 Dec 2010
Type Journal
Year 2008
Where SAC
Authors Rui Abreu, Alberto González 0002, Peter Zoeteweij, Arjan J. C. van Gemund
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