Computing bounds for fault tolerance using formal techniques

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Computing bounds for fault tolerance using formal techniques
Continuously shrinking feature sizes result in an increasing susceptibility of circuits to transient faults, e.g. due to environmental radiation. Approaches to implement fault tolerance are known. But assessing the fault tolerance of a given circuit is a tough problem. Here, we propose the use of formal methods to assess the robustness of a digital circuit with respect to transient faults. Our formal model uses a fixed bound in time to cope with the complexity of the underlying sequential equivalence check. The result is a lower and an upper bound on the robustness. The underlying algorithm and techniques to improve the efficiency are presented. In experiments the method is evaluated on circuits with different fault detection mechanisms. Categories and Subject Descriptors B.8.1 [Performance and Reliability]: Reliability, Testing, and FaultTolerance; B.6.3 [Logic Design]: Design AidsVerification General Terms Verification, fault tolerance, robustness Keywords Fault Tolerance, SAT, Form...
André Sülflow, Görschwin Fey, Rol
Added 12 Nov 2009
Updated 12 Nov 2009
Type Conference
Year 2009
Where DAC
Authors André Sülflow, Görschwin Fey, Rolf Drechsler
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