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DAC
2004
ACM

Defect tolerant probabilistic design paradigm for nanotechnologies

10 years 19 hour ago
Defect tolerant probabilistic design paradigm for nanotechnologies
Recent successes in the development and self-assembly of nanoelectronic devices suggest that the ability to manufacture dense nanofabrics is on the near horizon. However, the tremendous increase in device density of nanoelectronics will be accompanied by a substantial increase in hard and soft faults, posing a major challenge to current design methodologies and tools. In this paper we propose a novel probabilistic design paradigm for defective but reconfigurable nanofabrics. The new design goal is to devise an appropriate structural/behavioral decomposition which improves scalability by constraining the reconfiguration process, while meeting a desired probability of successful instantiation, i.e, yield. Our approach not only addresses the scalability problem in configuring dense nanofabrics subject to defects, but gives a rich framework in which critical tradeoffs among performance, yield, and per chip cost can be explored. We present a concrete instance of the approach and show exten...
Margarida F. Jacome, Chen He, Gustavo de Veciana,
Added 13 Nov 2009
Updated 13 Nov 2009
Type Conference
Year 2004
Where DAC
Authors Margarida F. Jacome, Chen He, Gustavo de Veciana, Stephen Bijansky
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