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2003
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Detecting Intra-Word Faults in Word-Oriented Memories

10 years 9 months ago
Detecting Intra-Word Faults in Word-Oriented Memories
This paper improves upon the state of the art in testing word oriented memories. It first presents a complete set of fault models for intra-word coupling faults. Then, it establishes the data background sequence (DBS) for each intraword coupling fault. These DBSs will be compiled into a ´½ · ¾ £ ÐÓ ¾ µ £ Ò test with complete fault coverage of the target faults, where Ò is the size of the memory and the word size. The test length can be reduced to ¾ £ Ò when the intra-word faults are restricted to physical adjacent cells within a word.
Said Hamdioui, A. J. van de Goor, Mike Rodgers
Added 05 Jul 2010
Updated 05 Jul 2010
Type Conference
Year 2003
Where VTS
Authors Said Hamdioui, A. J. van de Goor, Mike Rodgers
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