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Diagnosing Faulty Functional Units in Processors by Using Automatically Generated Test Sets

10 years 3 months ago
Diagnosing Faulty Functional Units in Processors by Using Automatically Generated Test Sets
Microprocessor technology is increasingly used for many applications; the large market volumes call for cost containment in the production phase. Process yield for processor production is, however, far from ideal. To increase it fault diagnosis is an important means, since it can allow both process characterization and product repair by the usage of backup resources. This paper presents a novel methodology to discriminate faulty modules, rather than gates, in a microprocessor based on the automatic construction of diagnostic softwarebased test sets. The approach exploits a post-production test set, designed for software-based self-test, and an infrastructure IP to perform the diagnosis. An initial diagnostic test set is built, and then iteratively refined resorting to an evolutionary method. Experimental results are reported in the paper showing the feasibility and effectiveness of the approach for an Intel i8051 processor core.
Paolo Bernardi, Ernesto Sánchez, Massimilia
Added 25 Jun 2010
Updated 25 Jun 2010
Type Conference
Year 2005
Where MTV
Authors Paolo Bernardi, Ernesto Sánchez, Massimiliano Schillaci, Matteo Sonza Reorda, Giovanni Squillero
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